/*
   * Copyright (C) 2013 Google, Inc
   *
   * SPDX-License-Identifier:	GPL-2.0+
   */
  
  #include <common.h>
  #include <dm.h>
  #include <fdtdec.h>
  #include <spi.h>
  #include <spi_flash.h>
  #include <asm/state.h>
  #include <dm/test.h>
  #include <dm/util.h>
  #include <test/ut.h>
  
  /* Test that sandbox SPI flash works correctly */
  static int dm_test_spi_flash(struct unit_test_state *uts)
  {
  	/*
  	 * Create an empty test file and run the SPI flash tests. This is a
  	 * long way from being a unit test, but it does test SPI device and
  	 * emulator binding, probing, the SPI flash emulator including
  	 * device tree decoding, plus the file-based backing store of SPI.
  	 *
  	 * More targeted tests could be created to perform the above steps
  	 * one at a time. This might not increase test coverage much, but
  	 * it would make bugs easier to find. It's not clear whether the
  	 * benefit is worth the extra complexity.
  	 */
  	ut_asserteq(0, run_command_list(
  		"sb save hostfs - 0 spi.bin 200000;"
  		"sf probe;"
  		"sf test 0 10000", -1,  0));
  	/*
  	 * Since we are about to destroy all devices, we must tell sandbox
  	 * to forget the emulation device
  	 */
  	sandbox_sf_unbind_emul(state_get_current(), 0, 0);
  
  	return 0;
  }
  DM_TEST(dm_test_spi_flash, DM_TESTF_SCAN_PDATA | DM_TESTF_SCAN_FDT);