28 Apr, 2017
1 commit
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Existing overlay unit tests examine individual pieces of the overlay
code. The new tests target the entire process of applying an overlay.Signed-off-by: Frank Rowand
Signed-off-by: Rob Herring
25 Mar, 2015
2 commits
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This patch just replace the string 'selftest' with 'unittest'
in OF unittest and data and binding file.I have tested it successfully on ARM.
Signed-off-by: Wang Long
Signed-off-by: Rob Herring -
If CONFIG_OF_UNITTEST=y then a kernel image make will always cause .version to
be incremented, even if there are not source changes. This is caused by
a lack of dependency tracking and checking for
drivers/of/unittest-data/testcases.dtb.o.Signed-off-by: Frank Rowand
Signed-off-by: Rob Herring
05 Feb, 2015
1 commit
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Introduce I2C device tree overlay tests.
Tests insertion and removal of i2c adapters, i2c devices, and muxes.Signed-off-by: Pantelis Antoniou
Signed-off-by: Rob Herring
23 Jan, 2015
1 commit
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Introduce selftests for overlays using sub-devices present
in children nodes.Signed-off-by: Pantelis Antoniou
Signed-off-by: Grant Likely
25 Nov, 2014
2 commits
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Add unittests for OF overlays.
It tests overlay device addition/removal and whether
the apply revert sequence is correct.Changes since V1:
* Added local fixups entries.Signed-off-by: Pantelis Antoniou
Signed-off-by: Grant Likely -
The original resolver format is way too cryptic, switch
to using a tree based format that gets rid of repetitions,
is more compact and readable.At the same time, update the selftests to using the new local fixups
format.Signed-off-by: Pantelis Antoniou
[grant.likely: Squashed in testcase changes and merged similar functions]
Signed-off-by: Grant Likely
05 Nov, 2014
1 commit
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This is unit testing code. It should use that name because it makes more
sense than 'selftest'. Rename the files to match and rename the config
variable.Signed-off-by: Grant Likely