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Commit c48cb7ebfb42d997a3f4317a412992f403c717aa

Authored by Przemyslaw Marczak
Committed by Minkyu Kang
1 parent 08d6300a35
Exists in v2017.01-smarct4x and in 30 other branches 8qm-imx_v2020.04_5.4.70_2.3.0, emb_lf_v2022.04, pitx_8mp_lf_v2020.04, smarc-8m-android-10.0.0_2.6.0, smarc-8m-android-11.0.0_2.0.0, smarc-8mp-android-11.0.0_2.0.0, smarc-imx6_v2018.03_4.14.98_2.0.0_ga, smarc-imx7_v2017.03_4.9.11_1.0.0_ga, smarc-imx7_v2018.03_4.14.98_2.0.0_ga, smarc-imx_v2017.03_4.9.11_1.0.0_ga, smarc-imx_v2017.03_4.9.88_2.0.0_ga, smarc-imx_v2017.03_o8.1.0_1.3.0_8m, smarc-imx_v2018.03_4.14.78_1.0.0_ga, smarc-n7.1.2_2.0.0-ga, smarc-rel_imx_4.1.15_2.0.0_ga, smarc_8m-imx_v2018.03_4.14.98_2.0.0_ga, smarc_8m-imx_v2019.04_4.19.35_1.1.0, smarc_8m_00d0-imx_v2018.03_4.14.98_2.0.0_ga, smarc_8mm-imx_v2018.03_4.14.98_2.0.0_ga, smarc_8mm-imx_v2019.04_4.19.35_1.1.0, smarc_8mm-imx_v2020.04_5.4.24_2.1.0, smarc_8mp_lf_v2020.04, smarc_8mq-imx_v2020.04_5.4.24_2.1.0, smarc_8mq_lf_v2020.04, v2016.05-dlt, v2016.05-smarct3x, v2016.05-smarct3x-emmc, v2016.05-smarct4x, v2017.01-smarct3x, v2017.01-smarct3x-emmc

sandbox: add ADC unit tests 

This commit adds unit tests for ADC uclass's methods using sandbox ADC.

Testing proper ADC binding:
- dm_test_adc_bind()                    - device binding
- dm_test_adc_wrong_channel_selection() - checking wrong channel selection

Testing ADC supply operations:
- dm_test_adc_supply():
  - Vdd/Vss values validating
  - Vdd regulator updated value validating
  - Vdd regulator's auto enable state validating

Testing ADC operations results:
- dm_test_adc_single_channel_conversion() - single channel start/data
- dm_test_adc_single_channel_shot()       - single channel shot
- dm_test_adc_multi_channel_conversion()  - multi channel start/data
- dm_test_adc_multi_channel_shot()        - multi channel single shot

Signed-off-by: Przemyslaw Marczak <p.marczak@samsung.com>
Cc: Simon Glass <sjg@chromium.org>
Signed-off-by: Minkyu Kang <mk7.kang@samsung.com>

Showing 3 changed files with 170 additions and 0 deletions Side-by-side Diff

include/power/sandbox_pmic.h
Diff comments   View file @ c48cb7e
... ... @@ -126,6 +126,10 @@
126 126 #define SANDBOX_BUCK1_AUTOSET_EXPECTED_UA 200000
127 127 #define SANDBOX_BUCK1_AUTOSET_EXPECTED_ENABLE true
128 128  
  129 +/* BUCK2: for testing sandbox ADC's supply */
  130 +#define SANDBOX_BUCK2_INITIAL_EXPECTED_UV 3000000
  131 +#define SANDBOX_BUCK2_SET_UV 3300000
  132 +
129 133 /* LDO1/2 for testing regulator_list_autoset() */
130 134 #define SANDBOX_LDO1_AUTOSET_EXPECTED_UV 1800000
131 135 #define SANDBOX_LDO1_AUTOSET_EXPECTED_UA 100000
... ... @@ -33,5 +33,6 @@
33 33 obj-$(CONFIG_DM_USB) += usb.o
34 34 obj-$(CONFIG_DM_PMIC) += pmic.o
35 35 obj-$(CONFIG_DM_REGULATOR) += regulator.o
  36 +obj-$(CONFIG_ADC) += adc.o
36 37 endif
  1 +/*
  2 + * Tests for the driver model ADC API
  3 + *
  4 + * Copyright (c) 2015 Samsung Electronics
  5 + * Przemyslaw Marczak <p.marczak@samsung.com>
  6 + *
  7 + * SPDX-License-Identifier: GPL-2.0+
  8 + */
  9 +
  10 +#include <common.h>
  11 +#include <adc.h>
  12 +#include <dm.h>
  13 +#include <dm/root.h>
  14 +#include <dm/util.h>
  15 +#include <dm/test.h>
  16 +#include <errno.h>
  17 +#include <fdtdec.h>
  18 +#include <power/regulator.h>
  19 +#include <power/sandbox_pmic.h>
  20 +#include <sandbox-adc.h>
  21 +#include <test/ut.h>
  22 +
  23 +DECLARE_GLOBAL_DATA_PTR;
  24 +
  25 +static int dm_test_adc_bind(struct unit_test_state *uts)
  26 +{
  27 + struct udevice *dev;
  28 +
  29 + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
  30 + ut_asserteq_str(SANDBOX_ADC_DEVNAME, dev->name);
  31 +
  32 + return 0;
  33 +}
  34 +DM_TEST(dm_test_adc_bind, DM_TESTF_SCAN_FDT);
  35 +
  36 +static int dm_test_adc_wrong_channel_selection(struct unit_test_state *uts)
  37 +{
  38 + struct udevice *dev;
  39 +
  40 + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
  41 + ut_asserteq(-EINVAL, adc_start_channel(dev, SANDBOX_ADC_CHANNELS));
  42 +
  43 + return 0;
  44 +}
  45 +DM_TEST(dm_test_adc_wrong_channel_selection, DM_TESTF_SCAN_FDT);
  46 +
  47 +static int dm_test_adc_supply(struct unit_test_state *uts)
  48 +{
  49 + struct udevice *supply;
  50 + struct udevice *dev;
  51 + int uV;
  52 +
  53 + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
  54 +
  55 + /* Test Vss value - predefined 0 uV */
  56 + ut_assertok(adc_vss_value(dev, &uV));
  57 + ut_asserteq(SANDBOX_ADC_VSS_VALUE, uV);
  58 +
  59 + /* Test Vdd initial value - buck2 */
  60 + ut_assertok(adc_vdd_value(dev, &uV));
  61 + ut_asserteq(SANDBOX_BUCK2_INITIAL_EXPECTED_UV, uV);
  62 +
  63 + /* Change Vdd value - buck2 manual preset */
  64 + ut_assertok(regulator_get_by_devname(SANDBOX_BUCK2_DEVNAME, &supply));
  65 + ut_assertok(regulator_set_value(supply, SANDBOX_BUCK2_SET_UV));
  66 + ut_asserteq(SANDBOX_BUCK2_SET_UV, regulator_get_value(supply));
  67 +
  68 + /* Update ADC platdata and get new Vdd value */
  69 + ut_assertok(adc_vdd_value(dev, &uV));
  70 + ut_asserteq(SANDBOX_BUCK2_SET_UV, uV);
  71 +
  72 + /* Disable buck2 and test ADC supply enable function */
  73 + ut_assertok(regulator_set_enable(supply, false));
  74 + ut_asserteq(false, regulator_get_enable(supply));
  75 + /* adc_start_channel() should enable the supply regulator */
  76 + ut_assertok(adc_start_channel(dev, 0));
  77 + ut_asserteq(true, regulator_get_enable(supply));
  78 +
  79 + return 0;
  80 +}
  81 +DM_TEST(dm_test_adc_supply, DM_TESTF_SCAN_FDT);
  82 +
  83 +struct adc_channel adc_channel_test_data[] = {
  84 + { 0, SANDBOX_ADC_CHANNEL0_DATA },
  85 + { 1, SANDBOX_ADC_CHANNEL1_DATA },
  86 + { 2, SANDBOX_ADC_CHANNEL2_DATA },
  87 + { 3, SANDBOX_ADC_CHANNEL3_DATA },
  88 +};
  89 +
  90 +static int dm_test_adc_single_channel_conversion(struct unit_test_state *uts)
  91 +{
  92 + struct adc_channel *tdata = adc_channel_test_data;
  93 + unsigned int i, data;
  94 + struct udevice *dev;
  95 +
  96 + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
  97 + /* Test each ADC channel's value */
  98 + for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
  99 + ut_assertok(adc_start_channel(dev, tdata->id));
  100 + ut_assertok(adc_channel_data(dev, tdata->id, &data));
  101 + ut_asserteq(tdata->data, data);
  102 + }
  103 +
  104 + return 0;
  105 +}
  106 +DM_TEST(dm_test_adc_single_channel_conversion, DM_TESTF_SCAN_FDT);
  107 +
  108 +static int dm_test_adc_multi_channel_conversion(struct unit_test_state *uts)
  109 +{
  110 + struct adc_channel channels[SANDBOX_ADC_CHANNELS];
  111 + struct udevice *dev;
  112 + struct adc_channel *tdata = adc_channel_test_data;
  113 + unsigned int i, channel_mask;
  114 +
  115 + channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
  116 + ADC_CHANNEL(2) | ADC_CHANNEL(3);
  117 +
  118 + /* Start multi channel conversion */
  119 + ut_assertok(uclass_get_device_by_name(UCLASS_ADC, "adc", &dev));
  120 + ut_assertok(adc_start_channels(dev, channel_mask));
  121 + ut_assertok(adc_channels_data(dev, channel_mask, channels));
  122 +
  123 + /* Compare the expected and returned conversion data. */
  124 + for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
  125 + ut_asserteq(tdata->data, channels[i].data);
  126 +
  127 + return 0;
  128 +}
  129 +DM_TEST(dm_test_adc_multi_channel_conversion, DM_TESTF_SCAN_FDT);
  130 +
  131 +static int dm_test_adc_single_channel_shot(struct unit_test_state *uts)
  132 +{
  133 + struct adc_channel *tdata = adc_channel_test_data;
  134 + unsigned int i, data;
  135 +
  136 + for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++) {
  137 + /* Start single channel conversion */
  138 + ut_assertok(adc_channel_single_shot("adc", tdata->id, &data));
  139 + /* Compare the expected and returned conversion data. */
  140 + ut_asserteq(tdata->data, data);
  141 + }
  142 +
  143 + return 0;
  144 +}
  145 +DM_TEST(dm_test_adc_single_channel_shot, DM_TESTF_SCAN_FDT);
  146 +
  147 +static int dm_test_adc_multi_channel_shot(struct unit_test_state *uts)
  148 +{
  149 + struct adc_channel channels[SANDBOX_ADC_CHANNELS];
  150 + struct adc_channel *tdata = adc_channel_test_data;
  151 + unsigned int i, channel_mask;
  152 +
  153 + channel_mask = ADC_CHANNEL(0) | ADC_CHANNEL(1) |
  154 + ADC_CHANNEL(2) | ADC_CHANNEL(3);
  155 +
  156 + /* Start single call and multi channel conversion */
  157 + ut_assertok(adc_channels_single_shot("adc", channel_mask, channels));
  158 +
  159 + /* Compare the expected and returned conversion data. */
  160 + for (i = 0; i < SANDBOX_ADC_CHANNELS; i++, tdata++)
  161 + ut_asserteq(tdata->data, channels[i].data);
  162 +
  163 + return 0;
  164 +}
  165 +DM_TEST(dm_test_adc_multi_channel_shot, DM_TESTF_SCAN_FDT);